| View previous topic :: View next topic |
| Author |
Message |
russK
l33t
Joined: 27 Jun 2006
Posts: 665
|
 Posted: Wed Nov 16, 2011 2:00 am Post subject: Errors from smartd |
 |
|
Can anyone tell me which if any of these errors from smartd I should be concerned about?:
| Code: |
Device: /dev/sda, SMART Usage Attribute: 193 Load_Cycle_Count changed from 161 to 160
Device: /dev/sda, SMART Usage Attribute: 7 Seek_Error_Rate changed from 100 to 200
Device: /dev/sda, SMART Usage Attribute: 7 Seek_Error_Rate changed from 200 to 100
Device: /dev/sdb, SMART Usage Attribute: 7 Seek_Error_Rate changed from 100 to 200
Device: /dev/sdb, SMART Usage Attribute: 9 Power_On_Hours changed from 77 to 76
Device: /dev/sdc, SMART Usage Attribute: 7 Seek_Error_Rate changed from 100 to 200
Device: /dev/sdc, SMART Usage Attribute: 7 Seek_Error_Rate changed from 200 to 100
Device: /dev/sdd, SMART Usage Attribute: 7 Seek_Error_Rate changed from 100 to 200
Device: /dev/sdd, SMART Usage Attribute: 9 Power_On_Hours changed from 77 to 76
Device: /dev/sde, SMART Usage Attribute: 7 Seek_Error_Rate changed from 200 to 100
Device: /dev/sdf, SMART Prefailure Attribute: 1 Raw_Read_Error_Rate changed from 100 to 102
Device: /dev/sdf, SMART Prefailure Attribute: 1 Raw_Read_Error_Rate changed from 102 to 104
Device: /dev/sdf, SMART Prefailure Attribute: 1 Raw_Read_Error_Rate changed from 104 to 105
Device: /dev/sdf, SMART Prefailure Attribute: 1 Raw_Read_Error_Rate changed from 105 to 106
Device: /dev/sdf, SMART Prefailure Attribute: 1 Raw_Read_Error_Rate changed from 106 to 108
Device: /dev/sdf, SMART Prefailure Attribute: 1 Raw_Read_Error_Rate changed from 108 to 110
Device: /dev/sdf, SMART Prefailure Attribute: 1 Raw_Read_Error_Rate changed from 110 to 111
Device: /dev/sdf, SMART Prefailure Attribute: 1 Raw_Read_Error_Rate changed from 111 to 112
Device: /dev/sdf, SMART Prefailure Attribute: 1 Raw_Read_Error_Rate changed from 112 to 113
Device: /dev/sdf, SMART Prefailure Attribute: 1 Raw_Read_Error_Rate changed from 113 to 114
Device: /dev/sdf, SMART Prefailure Attribute: 1 Raw_Read_Error_Rate changed from 114 to 115
Device: /dev/sdf, SMART Prefailure Attribute: 1 Raw_Read_Error_Rate changed from 115 to 117
Device: /dev/sdf, SMART Prefailure Attribute: 1 Raw_Read_Error_Rate changed from 117 to 118
Device: /dev/sdf, SMART Prefailure Attribute: 1 Raw_Read_Error_Rate changed from 118 to 119
Device: /dev/sdf, SMART Prefailure Attribute: 1 Raw_Read_Error_Rate changed from 119 to 120
Device: /dev/sdf, SMART Prefailure Attribute: 1 Raw_Read_Error_Rate changed from 120 to 100
Device: /dev/sdf, SMART Usage Attribute: 195 Hardware_ECC_Recovered changed from 35 to 36
Device: /dev/sdf, SMART Usage Attribute: 195 Hardware_ECC_Recovered changed from 36 to 35
Device: /dev/sdf, SMART Usage Attribute: 195 Hardware_ECC_Recovered changed from 36 to 37
Device: /dev/sdf, SMART Usage Attribute: 195 Hardware_ECC_Recovered changed from 37 to 36
Device: /dev/sdf, SMART Usage Attribute: 195 Hardware_ECC_Recovered changed from 37 to 38
Device: /dev/sdf, SMART Usage Attribute: 195 Hardware_ECC_Recovered changed from 38 to 39
Device: /dev/sdf, SMART Usage Attribute: 195 Hardware_ECC_Recovered changed from 39 to 40
Device: /dev/sdf, SMART Usage Attribute: 195 Hardware_ECC_Recovered changed from 40 to 41
Device: /dev/sdf, SMART Usage Attribute: 195 Hardware_ECC_Recovered changed from 41 to 42
Device: /dev/sdf, SMART Usage Attribute: 195 Hardware_ECC_Recovered changed from 42 to 44
Device: /dev/sdf, SMART Usage Attribute: 195 Hardware_ECC_Recovered changed from 43 to 44
Device: /dev/sdf, SMART Usage Attribute: 195 Hardware_ECC_Recovered changed from 44 to 43
|
Thanks for any comments.
 |
|
| Back to top |
|
 |
russK
l33t
Joined: 27 Jun 2006
Posts: 665
|
| Posted: Thu Nov 17, 2011 2:30 am Post subject: |
|
|
Here is the output of smartctl -a /dev/sdf (seemed to have the most noise in the smartd output):
| Code: |
smartctl 5.40 2010-10-16 r3189 [x86_64-pc-linux-gnu] (local build)
Copyright (C) 2002-10 by Bruce Allen, http://smartmontools.sourceforge.net
=== START OF INFORMATION SECTION ===
Model Family: Seagate Barracuda 7200.12 family
Device Model: ST31000528AS
Serial Number: 6VP9N26S
Firmware Version: CC38
User Capacity: 1,000,204,886,016 bytes
Device is: In smartctl database [for details use: -P show]
ATA Version is: 8
ATA Standard is: ATA-8-ACS revision 4
Local Time is: Wed Nov 16 21:28:25 2011 EST
SMART support is: Available - device has SMART capability.
SMART support is: Enabled
=== START OF READ SMART DATA SECTION ===
SMART overall-health self-assessment test result: PASSED
General SMART Values:
Offline data collection status: (0x82) Offline data collection activity
was completed without error.
Auto Offline Data Collection: Enabled.
Self-test execution status: ( 0) The previous self-test routine completed
without error or no self-test has ever
been run.
Total time to complete Offline
data collection: ( 600) seconds.
Offline data collection
capabilities: (0x7b) SMART execute Offline immediate.
Auto Offline data collection on/off support.
Suspend Offline collection upon new
command.
Offline surface scan supported.
Self-test supported.
Conveyance Self-test supported.
Selective Self-test supported.
SMART capabilities: (0x0003) Saves SMART data before entering
power-saving mode.
Supports SMART auto save timer.
Error logging capability: (0x01) Error logging supported.
General Purpose Logging supported.
Short self-test routine
recommended polling time: ( 1) minutes.
Extended self-test routine
recommended polling time: ( 180) minutes.
Conveyance self-test routine
recommended polling time: ( 2) minutes.
SCT capabilities: (0x103f) SCT Status supported.
SCT Error Recovery Control supported.
SCT Feature Control supported.
SCT Data Table supported.
SMART Attributes Data Structure revision number: 10
Vendor Specific SMART Attributes with Thresholds:
ID# ATTRIBUTE_NAME FLAG VALUE WORST THRESH TYPE UPDATED WHEN_FAILED RAW_VALUE
1 Raw_Read_Error_Rate 0x000f 119 099 006 Pre-fail Always - 226384936
3 Spin_Up_Time 0x0003 094 094 000 Pre-fail Always - 0
4 Start_Stop_Count 0x0032 100 100 020 Old_age Always - 106
5 Reallocated_Sector_Ct 0x0033 100 100 036 Pre-fail Always - 0
7 Seek_Error_Rate 0x000f 078 060 030 Pre-fail Always - 73582718
9 Power_On_Hours 0x0032 093 093 000 Old_age Always - 6555
10 Spin_Retry_Count 0x0013 100 100 097 Pre-fail Always - 0
12 Power_Cycle_Count 0x0032 100 100 020 Old_age Always - 54
183 Runtime_Bad_Block 0x0032 095 095 000 Old_age Always - 5
184 End-to-End_Error 0x0032 100 100 099 Old_age Always - 0
187 Reported_Uncorrect 0x0032 100 100 000 Old_age Always - 0
188 Command_Timeout 0x0032 100 100 000 Old_age Always - 0
189 High_Fly_Writes 0x003a 100 100 000 Old_age Always - 0
190 Airflow_Temperature_Cel 0x0022 069 061 045 Old_age Always - 31 (Min/Max 25/32)
194 Temperature_Celsius 0x0022 031 040 000 Old_age Always - 31 (0 20 0 0)
195 Hardware_ECC_Recovered 0x001a 037 021 000 Old_age Always - 226384936
197 Current_Pending_Sector 0x0012 100 100 000 Old_age Always - 0
198 Offline_Uncorrectable 0x0010 100 100 000 Old_age Offline - 0
199 UDMA_CRC_Error_Count 0x003e 200 200 000 Old_age Always - 5
240 Head_Flying_Hours 0x0000 100 253 000 Old_age Offline - 113833813219862
241 Total_LBAs_Written 0x0000 100 253 000 Old_age Offline - 3096022063
242 Total_LBAs_Read 0x0000 100 253 000 Old_age Offline - 136131511
SMART Error Log Version: 1
No Errors Logged
SMART Self-test log structure revision number 1
Num Test_Description Status Remaining LifeTime(hours) LBA_of_first_error
# 1 Short offline Completed without error 00% 986 -
SMART Selective self-test log data structure revision number 1
SPAN MIN_LBA MAX_LBA CURRENT_TEST_STATUS
1 0 0 Not_testing
2 0 0 Not_testing
3 0 0 Not_testing
4 0 0 Not_testing
5 0 0 Not_testing
Selective self-test flags (0x0):
After scanning selected spans, do NOT read-scan remainder of disk.
If Selective self-test is pending on power-up, resume after 0 minute delay.
|
It looks ok to me but I'm not familiar enough with smartctl to know for sure.
Thanks for any input. |
|
| Back to top |
|
|
|
|
You cannot post new topics in this forum
You cannot reply to topics in this forum
You cannot edit your posts in this forum
You cannot delete your posts in this forum
You cannot vote in polls in this forum
|
|
Kernel & Hardware
