View previous topic :: View next topic |
Author |
Message |
bukunu n00b
Joined: 26 Aug 2010 Posts: 7
|
Posted: Thu Aug 26, 2010 1:49 am Post subject: "disk has many bad sectors" one disk of Raid 0 aft |
|
|
Hello.
I use harddisk A and harddisk B to make Raid 0 with the raid control provided by my Asus P7P55D mainborad, and install the Gentoo on harddisk C.
After booting Gentoo, I first run:
and /dev/mapper/isw_eafjbcbfcf_Volume0 appears. Then I can use this volume as one harddisk. However, after rebooting, I always get the message "disk has many bad sectors" of harddisk B. I made no partition of harddisk A and B, but on harddisk C and /dev/mapper/isw_eafjbcbfcf_Volume0.
Code: | # fdisk -l /dev/sda
Device Boot Start End Blocks Id System
/dev/sda1 19 69769161 976768002 83 Linux
# fdisk -l /dev/sdb
Disk /dev/sdb doesn't contain a valid partition table
# fdisk -l /dev/sdc
Device Boot Start End Blocks Id System
/dev/sdc1 * 1 14 112423+ 83 Linux
/dev/sdc2 15 276 2104515 82 Linux swap / Solaris
/dev/sdc3 277 2888 20980890 83 Linux
/dev/sdc4 2889 60801 465186172+ 83 Linux
# fdisk -l /dev/mapper/isw_eafjbcbfcf_Volume0
Device Boot Start End Blocks Id System
/dev/mapper/isw_eafjbcbfcf_Volume0p1 19 69769161 976768002 83 Linux |
I want to know if this if a really error, or just a bug, and how to solve it.
Thanks. |
|
Back to top |
|
|
audiodef Watchman
Joined: 06 Jul 2005 Posts: 6639 Location: The soundosphere
|
|
Back to top |
|
|
Mad Merlin Veteran
Joined: 09 May 2005 Posts: 1155
|
|
Back to top |
|
|
bukunu n00b
Joined: 26 Aug 2010 Posts: 7
|
Posted: Mon Aug 30, 2010 2:54 am Post subject: |
|
|
I got such result after running: # smartctl -a /dev/sdb
Code: | smartctl version 5.38 [x86_64-pc-linux-gnu] Copyright (C) 2002-8 Bruce Allen
Home page is http://smartmontools.sourceforge.net/
=== START OF INFORMATION SECTION ===
Device Model: ST3500418AS
Serial Number: 9VM8GRXJ
Firmware Version: CC38
User Capacity: 500,107,862,016 bytes
Device is: Not in smartctl database [for details use: -P showall]
ATA Version is: 8
ATA Standard is: ATA-8-ACS revision 4
Local Time is: Mon Aug 30 02:53:01 2010 GMT
SMART support is: Available - device has SMART capability.
SMART support is: Enabled
=== START OF READ SMART DATA SECTION ===
SMART overall-health self-assessment test result: PASSED
General SMART Values:
Offline data collection status: (0x82) Offline data collection activity
was completed without error.
Auto Offline Data Collection: Enabled.
Self-test execution status: ( 0) The previous self-test routine completed
without error or no self-test has ever
been run.
Total time to complete Offline
data collection: ( 600) seconds.
Offline data collection
capabilities: (0x7b) SMART execute Offline immediate.
Auto Offline data collection on/off support.
Suspend Offline collection upon new
command.
Offline surface scan supported.
Self-test supported.
Conveyance Self-test supported.
Selective Self-test supported.
SMART capabilities: (0x0003) Saves SMART data before entering
power-saving mode.
Supports SMART auto save timer.
Error logging capability: (0x01) Error logging supported.
General Purpose Logging supported.
Short self-test routine
recommended polling time: ( 1) minutes.
Extended self-test routine
recommended polling time: ( 86) minutes.
Conveyance self-test routine
recommended polling time: ( 2) minutes.
SCT capabilities: (0x103f) SCT Status supported.
SCT Feature Control supported.
SCT Data Table supported.
SMART Attributes Data Structure revision number: 10
Vendor Specific SMART Attributes with Thresholds:
ID# ATTRIBUTE_NAME FLAG VALUE WORST THRESH TYPE UPDATED WHEN_FAILED RAW_VALUE
1 Raw_Read_Error_Rate 0x000f 114 099 006 Pre-fail Always - 74414633
3 Spin_Up_Time 0x0003 097 097 000 Pre-fail Always - 0
4 Start_Stop_Count 0x0032 100 100 020 Old_age Always - 68
5 Reallocated_Sector_Ct 0x0033 098 098 036 Pre-fail Always - 113
7 Seek_Error_Rate 0x000f 081 060 030 Pre-fail Always - 120112532
9 Power_On_Hours 0x0032 095 095 000 Old_age Always - 4859
10 Spin_Retry_Count 0x0013 100 100 097 Pre-fail Always - 0
12 Power_Cycle_Count 0x0032 100 100 020 Old_age Always - 34
183 Unknown_Attribute 0x0032 100 100 000 Old_age Always - 0
184 Unknown_Attribute 0x0032 100 100 099 Old_age Always - 0
187 Reported_Uncorrect 0x0032 100 100 000 Old_age Always - 0
188 Unknown_Attribute 0x0032 100 098 000 Old_age Always - 6
189 High_Fly_Writes 0x003a 100 100 000 Old_age Always - 0
190 Airflow_Temperature_Cel 0x0022 067 059 045 Old_age Always - 33 (Lifetime Min/Max 30/40)
194 Temperature_Celsius 0x0022 033 041 000 Old_age Always - 33 (0 18 0 0)
195 Hardware_ECC_Recovered 0x001a 045 021 000 Old_age Always - 74414633
197 Current_Pending_Sector 0x0012 100 100 000 Old_age Always - 0
198 Offline_Uncorrectable 0x0010 100 100 000 Old_age Offline - 0
199 UDMA_CRC_Error_Count 0x003e 200 200 000 Old_age Always - 1
240 Head_Flying_Hours 0x0000 100 253 000 Old_age Offline - 83202106463045
241 Unknown_Attribute 0x0000 100 253 000 Old_age Offline - 3975240484
242 Unknown_Attribute 0x0000 100 253 000 Old_age Offline - 3245739567
SMART Error Log Version: 1
No Errors Logged
SMART Self-test log structure revision number 1
No self-tests have been logged. [To run self-tests, use: smartctl -t]
SMART Selective self-test log data structure revision number 1
SPAN MIN_LBA MAX_LBA CURRENT_TEST_STATUS
1 0 0 Not_testing
2 0 0 Not_testing
3 0 0 Not_testing
4 0 0 Not_testing
5 0 0 Not_testing
Selective self-test flags (0x0):
After scanning selected spans, do NOT read-scan remainder of disk.
If Selective self-test is pending on power-up, resume after 0 minute delay.
|
|
|
Back to top |
|
|
|